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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

What's new in OptiLayer in 2001

  • Due to the unique mathematical know-how OptiLayer has always been the fastest thin-film software in the world. This year the computational power of OptiLayer has been increased even more. Now OptiLayer is the only one thin-film software that implements multiprocessing computations (parallel computations). This speeds up computations essentially when OptiLayer is used at multiprocessor PC-s operating under Windows NT, Windows 2000, and Windows XP. Multiprocessing is implemented in all three programs: OptiLayer, OptiChar, and OptiRE.
  •  A new breakthrough  De-Sensitization option has been introduced in OptiLayer. For the first time in the history of optical coatings design OptiLayer has option specially aimed for the designing of coatings with low sensitivity to thickness errors. This breakthrough has become possible only due to the unique analytical algorithms elaborated by the authors of OptiLayer.
  •  A unique OptiLayer option for the automated design of WDM filters has been further improved in several directions. It seems to be unbelievable but the tremendous computational speed of this option has been increased  several times as compared to the 2000 year OptiLayer versions. A new Collection database is added to the WDM filters design option. It often happens that a series of various filter designs with excellent spectral properties are obtained in one run of the automated design option. Now the user has an ability to extract these designs one by one and to examine them using various OptiLayer analysis options, for example, to the examine production yield of these designs (see below).
  • A new option allowing to use arbitrary external targets is added to the WDM filter design option. This option provides an alternative way to specifying WDM filter performance as compared to the main option dialog specifications (filter width, shape factor, etc.). This new option is aimed to solve most complicated and challenging WDM filter design problems connected with new telecommunication applications.
  • WDM Error Analysis option has been further improved. Now it can estimate the expected production yield of various filter designs depending on the estimated noise of optical monitoring scheme, parameters characterizing the instability of deposition rates, etc.  
  •  A set of new analytical algorithms for precise computations of group delay and group delay dispersion characteristics was implemented in all major analysis and synthesis modes of OptiLayer, including all first and second order optimization routines. Along with the tremendous accuracy this provides also the computations speed level which is inaccessible to other thin film programs. Due to this fact OptiLayer is able to solve the most complicated design problems connected with various ultra-short pulses applications, like femtosecond laser applications, new challenging telecommunication applications, etc.
  •  Detail investigation of phase properties of multilayers has become increasingly important in connection with many modern applications. These properties are tightly connected with zeros and poles of amplitude transmission and reflection coefficients. For this reason a highly scientific Zeros and Poles option has been moved from the scientific version of OptiLayer to the commercially available versions. This option enables you to investigate the locations of zeros and poles and to examine related phase properties (like group delay ripples, steepness of phase slopes, etc.)
  • To answer the requirements connected with the forthcoming 40 Gbit/sec applications, new "WDM Filter GD Performance" option was included in OptiLayer. This option enables you to interactively examine the relation between the shape of the WDM transmittance and group delay ripples in the transition zone. You can adjust either transmittance or group delay according to your requirements, to examine correlation between these characteristics, and to choose those characteristics that are most suitable for your particular needs.
  •  As a further development of Varian instrumentation support both OptiChar and OptiRE provide a new capability to automatically import multiscan measurements from Cary spectrophotometers.
  •  OptiRE has a new option for the simultaneous analysis of several measurements scans. This boarders essentially OptiRE potentialities. In particular it is possible to perform post-production characterization of multilayers basing on the multiple measurement scans obtained after deposition of each new layer.
  •  With the permission of TFCalc software the TFCalc files import option is added to the OptiLayer file menu. This make the data exchange between TFCalc and OptiLayer software an easy task.

 

 

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

Advanced

Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

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