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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

What's new in OptiLayer in 2003 (version 4.76)

  • To enhance pre-production analysis capabilities of OptiLayer a new Interface Scattering option has been developed. This option allowsyouto estimate the influence of small scale and large scale interface roughness of coating layers on spectral characteristics of optical coatings at normal light incidence.
  • Thin Layer Removal option is one of the OptiLayer options aimed to improve manufacturability of optical coating designs. This option is essentially improved in the new OptiLayer version and it allows you to effectively remove thin layers without noticeable degradation of an optical coating performance.
  • Computational effectiveness of the OptiLayer design modes and, in particular, of the Gradual Evolution mode is permanently improved. The Gradual Evolution mode allowsyouto solve design problems without any starting design. It is often advisable not to use starting designs because in this way you can obtain a full set of solutions with various combinations of main design parameters, which is necessary for choosing the most practical design. To provide an additional flexibility in this respect, the Remove Design command was added to the Data menu.
  •  Presentation capabilities of the OptiLayer analysis modes have been further improved. In particular, a chart presentation has been added to the Layer Sensitivity analysis mode. A new "Additional" command has been added to the right-click menus of all windows of various Evaluation modes. This allows you to create additional windows for a simultaneous evaluation of spectral characteristics in different spectral bands and in different scales.
  •  Numerous improvements have been done in OptiLayer color evaluation modes. The Color Evaluation command allows the user to use the most complete set of color coordinate systems. Along with xyzL Chromaticities (CIE 1931) you can use CIE YUV 1960, CIE YU'V' 1976, CIE L*u*v*, CIE L*a*b*, Hunter Lab, CIE C*hs(uv), CIE HLC systems. Dominant and Complimentary wavelengths, Excitation Purity, Correlated Color Temperature can be evaluated and displayed. Observer can be selected as 2 deg (CIE 1931) or 10 deg (CIE 1964). A set of available Reference White Sources includes CIE-A, CIE-B, CIE-C, D55, D65, D75, ISO 9845-1, Uniform Distribution, Black Body with an arbitrary temperature. A custom light source can be specified as well. In the last case it is possible to use any light source from the Light Source Database as a Reference White.
  •  In the new OptiLayer version Source and Detector data are used to modify transmittance (T), reflectance (R), and absorptance (A), if the command "Use loaded source and detector during R, T, A computations" is active. Mathematical kernels of all OptiLayer synthesis modes have been updated in order to work correctly with such modified T, R, A data.  
  •  "Update" buttons were added to many Analysis/Synthesis dialog windows. This is done for the user convenience in choosing various analysis and synthesis options. "OK" buttons in these dialog windows were renamed as "Close" buttons.
  •  In OptiChar and OptiRE, an ability to save determined substrate/layer material parameters in a formula form was added. View -> Substrate Parameters, View -> Layer Parameters commands allow the user to display formula results obtained by the characterization procedure.
  •  In OptiChar the Layer Material database has been added. This allows you to use files from this database for different purposes, for example, as initial approximations for the Layer Refinement procedure. Files in a tabular format are automatically converted to the OptiChar Layer model presentation.  
  •  An ability to combine several measurement data files for a simultaneous characterization analysis is added in OptiChar. The Measurement Preprocessing option is modified for this purpose.  
  •  A number of improvements have been done in OptiChar with respect to the used refractive index models. An output of the Cauchy model coefficients has been modified to provide a better consistency with other OptiLayer modules. These coefficients are now dimensional, expressed for the case of wavelength in mkm. Sellmeier models have been  added for the refractive index and extinction coefficient.
  •  In all programs, an access to the Catalog has been moved to the File menu. This makes the Catalog option more user-friendly because it is possible now to transfer data from the Catalog in a much shorter way.  
  •  The PNG image format has been added in the Save As... commands of all programs. PNG stands for the Portable Network Image format which is now widely used in the Internet.
  •  The X,Y data files import command was added in all programs in order to simplify the input of target/measurement data files specified in the form of a 2-column file of a type Wavelength/Value.
  •  Optical density presentation for the transmittance (T) and reflectance (R) was added in all program.

 

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

Advanced

Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

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