Agenda
of the 14-th European OptiLayer Workshop
"Optical Coatings for Modern Applications"
Organized by Alfred Thelen,
Alexander Tikhonravov, Michael Trubetskov,
and Irmgard Langbein
Special guest speakers: George Dobrowolski and Hans Pulker
Workshop dates: March 22 - 24, 2010
Location: Laser Zentrum Hannover, Germany
Registration form can be downloaded here (MS Word format).
We have reservations in:
Hotel Körner, Körnerstrasse 24-25, 30159 Hannover
Telefon: (0511) 1636-0
Telefax: (0511) 18048
http://www.hotelkoerner.de
Monday, March 22
| 9:00 am | Opening remarks (Irmgard Langbein) |
| 9:10 | From the history of thin films and introduction to OptiLayer software (Alfred Thelen and Alexander Tikhonravov) |
| 9:55 | Modern principles of software interface implemented in OptiLayer software (Michael Trubetskov) |
| 10:40 | Coffee break |
| 11:00 | Advanced topics in the analysis of multilayers (Alexander Tikhonravov) |
| 11:45 | Overview of modern design techniques (Alexander Tikhonravov) |
| 12:30 | Lunch |
| 13:30 | Some challenges in the design and manufacture of optical thin film systems (George Dobrowolski) |
| 14:15 | Some aspects for the optimization of high quality laser coatings (Detlev Ristau) |
| 15:00 | Coffee break |
| 15:20 | Practical aspects of designing and choice of design strategy for general application coatings (Alexander Tikhonravov) |
| 16:05 | Design of narrow band pass filters and optical coatings for special applications in telecommunications, medicine, etc. (Alexander Tikhonravov) |
| 18:00 | Workshop reception (dinner will be provided) |
Tuesday, March 23
| 9:00 am | Presentation capabilities of OptiLayer software (Michael Trubetskov) |
| 9:45 | Design of multilayers for ultra fast applications (coatings with phase, group delay and group delay dispersion specifications) (Alexander Tikhonravov) |
| 10:30 | Coffee break |
| 10:50 | Color analysis and design of coatings for color applications (Tatiana Amotchkina) |
| 11:35 | What’s new in OptiLayer software (Michael Trubetskov) |
| 12:20 | Lunch |
| 13:30 | Pre-production error analysis and choosing designs with the best probability of a high manufacturing yield (Alexander Tikhonravov) |
| 14:15 | Overview of monitoring techniques and recent advances in optical monitoring (Alexander Tikhonravov) |
| 15:00 | Coffee break |
| 15:20 | Remote control feature in OptiLayer software - status report on application to virtual and real PIAD experiments (Olaf Stenzel) |
| 16:05 | Computational manufacturing as a tool for raising production yields (Alexander Tikhonravov) |
Wednesday, March 24
| 9:00 am | Metal oxide coatings for interference optics - state of the art in production (Hans Pulker) |
| 9:45 | Advances in virtual deposition processes and broadband optical monitoring (H. Ehlers and S. Schlichting) |
| 10:30 | Coffee break |
| 10:50 | Import of data to the programs of OptiLayer software family (Tatiana Amotchkina) |
| 11:35 | Optical characterization of thin films – basic concepts (Alexander Tikhonravov) |
| 12:20 | Lunch |
| 13:30 | Methodology of thin film characterization based on spectral photometric data (Tatiana Amotchkina) |
| 14:15 | Thin film characterization using spectral ellipsometric data (Tatiana Amotchkina) |
| 15:00 | Coffee break |
| 15:20 | Reverse engineering of optical coatings with OptiRE (Alexander Tikhonravov) |
| 16.05 | Integrating OptiLayer thin film software in the production environment (Michael Trubetskov) |
| 16:50 | Closing remarks (Irmgard Langbein) |
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