Preliminary Agenda
of the 7-th North-American OptiLayer Workshop
"Advanced thin film optical coatings"
Organized by Jennifer Kruschwitz,
Alexander Tikhonravov,
and Michael Trubetskov
November 16-19, 2009, Santa Clara, Biltmore Hotel
Registration form is here (PDF format).Monday, November 16
| 9:00 am | Opening remarks (Jennifer Kruschwitz) |
| 9:10 | Basic principles of thin film theory and introduction to OptiLayer software (Alexander Tikhonravov) |
| 9:55 | Modern principles of software interface implemented in OptiLayer software (Michael Trubetskov) |
| 10:40 | Coffee break |
| 11:00 | Fresnel equations, Brewster's angle, TIR, incoherent multiple reflections (Jennifer Kruschwitz) |
| 11:45 | Advanced topics in the analysis of multilayers. Using OptiLayer analysis options for solar cells and other applications. (Alexander Tikhonravov) |
| 12:30 | Lunch |
| 13:30 | Graphical techniques, vector diagrams, simple AR and HR, metals (Jennifer Kruschwitz) |
| 14:15 | Overview of modern design techniques (Alexander Tikhonravov) |
| 15:00 | Coffee break |
| 15:20 | High reflectors, overlapping stacks, metal coatings, tilted coatings, polarizers, phase effects (Jennifer Kruschwitz) |
| 16:05 | Practical aspects of designing and choice of design strategy for general application coatings (Alexander Tikhonravov) |
| 18:00 | Workshop reception (dinner will be provided) |
Tuesday, November 17
| 9:00 am | Presentation capabilities of OptiLayer software (Michael Trubetskov) |
| 9:45 | Design of narrow band pass filters and optical coatings for special applications in telecommunications, medicine, etc. (Alexander Tikhonravov) |
| 10:30 | Coffee break |
| 10:50 | Color analysis and design of coatings for color applications (Michael Trubetskov) |
| 11:35 | Design of multilayers for ultrafast applications (coatings with phase, group delay and group delay dispersion specifications) (Alexander Tikhonravov) |
| 12:20 | Lunch |
| 13:30 | What's new in OptiLayer software (Michael Trubetskov) |
| 14:15 | Pre-production error analysis and choosing designs with the best probability of a high manufacturing yield (Alexander Tikhonravov) |
| 15:00 | Coffee break |
| 15:20 | Overview of monitoring techniques for optical coating production (Alexander Tikhonravov) |
| 16:05 | Recent advances in optical monitoring (Alexander Tikhonravov) |
Wednesday, November 18
| 9:00 am | Computational manufacturing as a tool for raising production yields (Alexander Tikhonravov) |
| 9:45 | Import of data to the programs of OptiLayer software family (Michael Trubetskov) |
| 10:30 | Coffee break |
| 10:50 | Optical characterization of thin films - basic concepts (Alexander Tikhonravov) |
| 11:35 | Methodology of thin film characterization based on spectral photometric data (Alexander Tikhonravov) |
| 12:20 | Lunch |
| 13:30 | Thin film characterization using spectral ellipsometric data (Alexander Tikhonravov) |
| 14:15 | Reverse engineering of optical coatings with OptiRE (Alexander Tikhonravov) |
| 15:00 | Coffee break |
| 15:20 | Integrating OptiLayer thin film software in the production environment (Michael Trubetskov) |
| 16:05 | Round table discussions and Q&A session |
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