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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

 S. Nevas, F. Manoocheri, E. Ikonen, A. V. Tikhonravov, M. A. Kokarev, M. K. Trubetskov, "Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidence", Proc. SPIE. 5250, Advances in Optical Thin Films 234 (2004)

 A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, M. A. Kokarev, "Key role of the coating total optical thickness in solving design problems", Proc. SPIE. 5250, Advances in Optical Thin Films 312 (2004)

 A. V. Tikhonravov, M. K. Trubetskov, "Online characterization and reoptimization of optical coatings", Proc. SPIE. 5250, Advances in Optical Thin Films 406 (2004)

 K. Starke, D. Ristau, H. Welling, T. V. Amotchkina, M. K. Trubetskov, A. A. Tikhonravov, A. S. Chirkin, "Investigations in the nonlinear behavior of dielectrics by using ultrashort pulses (Best Oral Presentation)", Proc. SPIE. 5273, Laser-Induced Damage in Optical Materials: 2003 501 (2004)

 A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, and A. Duparre', "Effects of interface roughness on the spectral properties of thin films and multilayers ," Appl. Opt. 42, 5140-5148 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, "Application of advanced optimization concepts to the design of high quality optical coatings", Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life 1061 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, G. W. DeBell, "On the accuracy of optical thin film parameter determination based on spectrophotometric data", Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 190 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, D. Ristau, S. Günster, Reliable determination of wavelength dependence of thin film refractive index, Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 331 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, A. Duparr, E. Quesnel, D. Ristau, and S. Günster, "Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films ," Appl. Opt. 41, 2555-2560 (2002)

A. V. Tikhonravov and M. K. Trubetskov, "Automated design and sensitivity analysis of wavelengh-division multiplexing filters ," Appl. Opt. 41, 3176-3182 (2002).

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

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Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

Advanced

Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

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