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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

Our publications in 2002-2003:

 A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, and A. Duparre', "Effects of interface roughness on the spectral properties of thin films and multilayers ," Appl. Opt. 42, 5140-5148 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, "Application of advanced optimization concepts to the design of high quality optical coatings", Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life 1061 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, G. W. DeBell, "On the accuracy of optical thin film parameter determination based on spectrophotometric data", Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 190 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, D. Ristau, S. Günster, Reliable determination of wavelength dependence of thin film refractive index, Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 331 (2003)

A.V. Tikhonravov, M.K. Trubetskov, A.A. Tikhonravov, A. Duparre', "Effects of interface roughness on the spectral properties of thin film multilayers", Appl. Opt., Vol. 42, pp. 5140-5148 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, A. Duparr, E. Quesnel, D. Ristau, and S. Günster, "Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films ," Appl. Opt. 41, 2555-2560 (2002)

A. V. Tikhonravov and M. K. Trubetskov, "Automated design and sensitivity analysis of wavelengh-division multiplexing filters ," Appl. Opt. 41, 3176-3182 (2002)

A. Thelen, M. Tilsch, A. V. Tikhonravov, M. K. Trubetskov, and U. Brauneck, "Topical meeting on Optical Interference Coatings (OIC ’2001): design contest results," Appl. Opt. 41, 3022-3038 (2002)

D. Ristau, S. Gunster, S. Bosch, A. Duparre, E. Masetti, J. Ferre-Borrull, G. Kiriakidis, F. Peiro, E. Quesnel, and A. Tikhonravov, "Ultraviolet Optical and Microstructural Properties of MgF 2 and LaF 3 Coatings Deposited by Ion-Beam Sputtering and Boat and Electron-Beam Evaporation ," Appl. Opt. 41, 3196-3204 (2002)

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Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

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Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

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Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

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