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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

New Features in OptiLayer 2017 (version 12.12)

OptiLayer:

  • It is possible to change target weight factors using COM. The number of environments and an active environment can be changed with COM.
  • Added "Copy Special" command to evaluation-type windows where spectral characteristics are displayed. With this command it is possible to copy only these characteristics at a customized grid.
  • If Color evaluation is performed for a range of angles, these colors are displayed not only at graphical windows, but also in the spreadsheet tab.
  • In the Admittance diagram "Last Layer Only" option added. It helps in cases of coatings with many layers to understand better the role of the top layer.
  • U- and g-values dialog: added single-glazing (monolithic) case. This is the case of a single glass without gas spacers.
  • Implemented Cone Angle of Source and Cone Angle of Detector options. If only one object is loaded, computations are performed as before. For two objects, Cone angle is the minimum of two cone half-angles, the number of points for the integration (Cone averaging points) is the maximum of these two values. The intensities are multiplied for the same angle varying in the range from cone axis up to cone half-angle. Therefore the effect of biconical incidence combined with angular-dependent sensitivity of a detector are simulated.
  • Rugate synthesis is now possible in Multi-Environment mode.
  • Internal file read-write engine updated in order to accelerate these operations. Now the operations with extremely large data files takes 5-10 times less time.
  • "Normalize" check box added to the Integrals, Values selection dialog related to Integral values. It allows you to configure normalization option independently on Integral Target settings.
  • Target Generator views are optimized in order to better utilize the available space of the window.
  • WDM Filter design is now possible at oblique incidence for s- or p-polarization. This implemented as an additional option at the first WDM design dialog.
  • The quality of plot export to vector formats is improved.
  • Added adjustment of x- and y- axis units in the Plot Engine dialog.
  • Variator for OptiLayer allows you to adjust manually thicknesses of design layers, as well as refractive indices and extinction coefficients of layer materials. Substrate, incident medium, media included in Stack, exit medium also could be adjusted. If one of the refractive indices has been changed, OptiLayer will suggest to save the modified index to the database before using other commands.
  • The ability to show Integral, Values Inhomogeneities/Interlayer Evaluation is added. In this window you can see the initial theoretical values of the integral values and these values when Inhomogeneities/Interlayers are present.
  • The ability to show Integral, Values Systematic Deviations Evaluation is added. In this window you can see the initial theoretical values of the integral values and these values when Systematic Deviations are present.
  • The ability to show EFI Systematic Deviations Evaluation is added. In this window one can see the initial theoretical electric field and the electric field when Systematic Deviations are present.
  • DSG file export and import are updated in accordance with LZH 2017 specifications.
  • Eleven new Advanced Examples are added.

 OptiChar

  • Computations of Total losses with Transmittance and Back Reflectance characteristics are allowed.
  • Computations of Integrated Extinction with Transmittance and Back Reflectance characteristics are allowed.
  • Physical thickness units are now the default in OptiChar, since this is more convenient for absorbing, conductive, semi-conductor, etc. materials.
  • If Color evaluation is performed for a range of angles, these colors are displayed not only at graphical windows, but also in the spreadsheet tab.
  • The access to https://refractiveindex.INFO database is implemented: the convenient database browser and the ability to transfer any data file to Substrate or Layer Material databases.
  • Cone Angle of Source and Cone Angle of Detector options are implemented. If only one object is loaded, computations are performed as before. For two objects Cone angle is the minimum of two cone half-angles, the number of points for the integration (Cone averaging points) is the maximum of these two values. The intensities are multiplied for the same angle varying in the range from cone axis up to cone half-angle. Therefore the effect of biconical incidence combined with angular-dependent sensitivity of a detector are simulated.
  • Internal file read-write engine updated in order to accelerate these operations. Now the operations with extremely large data files takes 5-10 times less time.
  • The quality of plot export to vector formats is improved.
  • Measurement Preprocessing now can also remove a gap in measurements. It is useful to minimize the effect of water absorption in near infrared, for example.
  • Two new Advanced Examples are added.
  • The ability to show R, T, etc. simultaneously at the same Fitting window is added. The same is related to many other multi-tab windows.

OptiRE:

  • COM access to Color Target and Integral Target is implemented. Also it is possible to change target weight factors.
  • Computations of Total losses with Transmittance and Back Reflectance characteristics are allowed.
  • Refractive index offsets as different plots are now shown only if a corresponding model has been used (Linear or Exponential). It makes the display of refractive indices more concise.
  • If Color evaluation is performed for a range of angles, these colors are displayed not only at graphical windows, but also in the spreadsheet tab.
  • The access to https://refractiveindex.INFO database is implemented: convenient database browser and the ability to transfer any data file to Substrate or Layer Material databases.
  • Cone Angle of Source and Cone Angle of Detector options is implemented. If only one object is loaded, computations are performed as before. For two objects Cone angle is the minimum of two cone half-angles, the number of points for the integration (Cone averaging points) is the maximum of these two values. The intensities are multiplied for the same angle varying in the range from cone axis up to cone half-angle. Therefore the effect of biconical incidence combined with angular-dependent sensitivity of a detector are simulated.
  • Internal file read-write engine updated in order to accelerate these operations. Now the operations with extremely large data files takes 5-10 times less time.
  • With the help of a new evolutionary algorithm significantly improved the search for best fit in the case of multi-scan data. It is possible to select the method in the settings of Random Errors and Quasi-Random Errors.
  • Index drift is saved with material even if a compatible formula (Cauchy, Const) has been selected.
  • Designs with loaded materials and applied drift models are saved with modified refractive indices, if specified in the corresponding dialog.
  • The quality of plot export to vector formats is improved.
  • Added Variator command to the Solve menu. This command allows to easily vary thicknesses of layers and refractive index drifts and instantly see the effect of these variations in other OptiRE windows. The current model parameters are adjusted accordingly and are used as starting parameters for successive reverse-engineering steps. It is possible to use different controls for the variations. Deviations of physical thicknesses of each layer and refractive index drifts can be varied independently. Revert Back button allows to discard current variations and to return back to the previous model parameters.
  • Indirect monitoring is now supported. It is possible to specify the list of witness chips and a strategy of the deposition. All computations are internally converted to this multi-chip indirect monitoring case.
  • Measurement Preprocessing now can also remove a gap in measurements. It is useful to minimize the effect of water absorption in near infrared, for example.
  • Implemented display of witness chips and monitoring strategy in General Information Window. Chips and their thicknesses can be adjusted in General Information Window.
  • Added RE Spectra command (View menu). It allows you to open an additional evaluation windows to compare the performances of theoretical and RE designs. Characteristic, polarization, the angle of incidence, spectral range and scales can be adjusted for each of these windows independently.
  • DSG file export and import are updated in accordance with LZH 2017 specifications.
  • Two new Advanced Examples are added.
  • If not mentioned before - ability to show R, T, etc. simultaneously at the same Fitting window. The same is related to many other multi-tab windows.

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

Advanced

Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

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