Feature matrix comparing Professional and Lite versions of
OptiLayer
:
Feature
Pro
Lite
Multiple Problem Directories
+
+
File Transfer option
+
+
Backup/Restore
+
+
Substrates Catalog
+
+
Light Source catalog
+
+
Detector catalog
+
+
Open ODS file
+
-
Save Project As ODS or OPL file
+
-
Save window as bitmap (bmp, wmf, jpg, pcx, gif, png)
+
+
Import TFCalc data file
+
+
Import Essential Macleod data file
+
+
Import/Export Leybold Dispersion Data
+
-
Import/Export Leybold Monitoring Report
+
-
Export to MS Excel
+
+
Print Setup and Print
+
+
Versatile editing options
+
+
Import of ASCII data
+
+
Import x, y data
+
+
Collection and History windows
50 items
50 items
Memorize plots
+
-
Data, Targets
Angles of incidence
99
9
Spectral points for each angle
8192
8192
Transmittance s, p, a
+
+
Reflectance s, p, a
+
+
Absorptance s, p, a
+
+
Phase shift on Reflection, s, p
+
+
Phase Shift of Transmission, s, p
+
+
Differential Phase Shift on r and t
+
+
Group Delay and GDD for t, r (s, p cases)
+
-
Back Reflectance, s, p, a
+
-
User-Defined target
+
-
Data: Color Targets, Sources, Detectors
Max number of targets
99
9
Chromaticities
+
+
Tristimulus
+
+
CIE YU'V' 1976
+
+
CIE YUV 1960
+
-
Hunter Lab
+
-
CIE L*a*b*
+
-
CIE L*u*v*
+
-
CIE H0LC
+
-
CIE C*hs(uv)
+
-
Blackbody data generation
+
+
Normalize function
+
+
Detector
+
+
Data: Substrate, Incident Medium
Dispersion table
999 lines
999 lines
Formulae
+
+
Composition
+
-
Data: Layer Material
Dispersion table
999 lines
999 lines
Formulae
+
+
Composition
+
-
Changeable, refractive index
+
-
Changeable, composition
+
-
Data: Design
Max number of layers
65535
256
Flexible editing of different thicknesses
+
+
Design Formula
+
+
Refractive indices and Fraction editing for Changeable materials
+
-
Back side coating
+
+
Arrange Materials, abbreviation length:
2
2
Materials state selection (Active, Passive, Inactive, Exclusionary)
+
+
Multiple Environments, Environment Manager
+
-
Analysis
Evaluation of spectral characteristics
+
+
Spectral and Angular modes
+
+
GD and GDD evaluation
+
-
Ellipsometric Angles
+
-
Additional windows with independent settings
+
-
Averaging
+
+
Digitize
+
+
Color Evaluation
+
+
CRI Evaluation
+
-
Electric Field
+
+
Admittance
+
+
Refractive Index profile
+
+
Zeroes and Poles
+
-
WDM Filer GD performance
+
-
Rugates
+
-
Plot Engine
+
+
Error Analysis
+
+
Worst Case Analysis
+
-
Layer Sensitivity
+
+
Layers Inhomogeneity
+
-
Systematic Deviations
+
-
Interface Roughness
+
-
Interface Layers
+
-
Broadband Monitoring Simulation
+
-
WDM Error Analysis
+
-
Synthesis
Refinement
+
+
Constrained Optimization
+
+
Needle Optimization (manual)
+
-
Needle Optimization AUTO
+
+
Gradual Evolution
+
-
WDM Filter
+
-
Inhomogeneous Refinement
+
-
Random Optimization
+
-
De-Sensitization
+
-
Design Cleaner
+
+
Thin Layer Removal
+
+
Target Modifier
+
-
Modify Target directly in memory
+
-
Modify Color Target directly in memory
+
-
Modify Design directly in memory
+
+
Hyper-Newton
+
-
Modified DLS
+
+
Newton method
+
+
Sequential QP
+
-
Conjugate Gradients
+
-
Steepest Descent
+
-
Max number of simultaneous needle variations
any
any
Power index in target definition
1,2,4,6,8,
12,16
1,2,4,6,8,
12,16
Results
Monitoring Spreadsheet
+
-
Monitoring : t, r for s, p, a polarizations for any angle
+
-
Arbitrary sequence of chips
+
-
Allow chip reuse mode
+
-
Gain and zero adjustment
+
-
Spectral line width and shape
+
-
Monitoring report
+
-
Current Design report
+
+
Errors report
+
+
Worst Case report
+
-
Layer Sensitivity report
+
+
Layer Inhomogeneity report
+
-
Systematic Deviations report
+
-
Interface Roughness report
+
-
Interface Layers report
+
-
Evaluation report
+
+
GD and GDD report
+
-
Ellipsometry report
+
-
Electric Field report
+
+
Collection report
+
-
History report
+
+
Tabulate
+
+
Export WDM design to VPI
+
-
Configuration
Settings of different units
+
+
Database options
+
+
Multiprocessing support
+
-
