Menu
Spiegel6 Spiegel2 Spiegel14
OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

 Substrate Characterization

OptiChar allows you to characterize substrates on the basis of photometric and ellipsometric data. The set of substrate characterization models is the same as for layer characterization.  The only difference is that the thickness of the substrate is not determined in the course of the substrate characterization procedure.You have to specify the thickness of the substrate before starting the characterization procedure.

substrate characterization
substrate characterization Fitting of measured reflectance data related to CaF2 substrate by model reflectance. substrate characterizationFitting of measured transmittance data related to CaF2 substrate by model transmittance.

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, D. Ristau, S. Günster, Reliable determination of wavelength dependence of thin film refractive index, Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 331 (2003)

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

Advanced

Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

Go to top