### OptiLayer:

• Implemented new type of targets: Layer Absorptance Targets. This provides a possibility to optimize absorptance in one particular layer or in a specified group of layers. Learn more...
• Layer absorptance option: now loaded Layer Absorption Target is also shown in the Layer Absorptance Evaluation Window. Learn more...
• Layer absorptance evaluation window: now it is possible to adjust Y-axis scales independently from T, R Evaluation. In order to do this we use Options -> Axis -> Layer Absorptance tab. See more...
• OptiLayer allows now to check the change of colors due to Systematic Deviations, Interfaces and Interlayers, Roughness. This option is activated by corresponding selection of the corresponding setup dialogs. Changes of colors are illustrated graphically at Color diagrams and numerically in all available color spaces. Additionally the change of Dominant/Complimentary wavelength, Correlated Color Temperature, Color Rendering Index are represented. Also,  the change of Color is presented in terms of CIE DE2000 color change measure. More...
• Exhaustive search option has been developed. It is added as the third tab of the Random Optimization setup dialog.
• New big addition to OptiLayer synthesis: support of floating constants for all targets. It is possible to specify only constant offset, or more complicated offsets depending on frequency: $$C_1+C_2\cdot \omega$$ and $$C_1 + C_2\cdot \omega + C_3\cdot \omega^2$$. These new options are useful not only for ultrafast coatings, but in general case, when, for example, it is necessary to design a coating with constant T or R in some spectral region, and the absolute value of this characteristic is not important. Learn more...
• Improvements in Monochromatic Strategy Generator: adjustments of criteria in accordance with latest Leybold Optics recommendations. Bad Monitoring "Strategy" tab allows to display bad monitoring conditions of various layers exactly related to specified monitoring criteria of the generated strategy.
• Criterion for swing ratios was adjusted according to last Leybold Optics advises.
• Electric field plot now respects settings of Thickness units. Before X-axis was always represented in Physical thickness units.
• Deviations page has been added to Roughness evaluation window. It displays the deviations of spectral characteristics caused by roughnesses of different kind. See more...
• Roughness Evaluation is now possible without loaded design. It allows to estimate the influence of roughness of a single interface between substrate and incidence medium without additional tricks.
• Inaccuracy of roughness evaluation of large scale roughness in reflection has been noticed and fixed.
• Interlayers/Inhomogeneities option improvements: there is now the ability to select how the refractive index of interlayers is calculated. Available choices are similar to Mixture options of the Material editor. This option includes Average Weighted Value of Permittivities, Bruggemann's Formula, Average Weighed Value of Refractive Indices. As before, the proportion of adjacent materials in the mixture is 50%. This selection affects both Inhomogeneities/Interlayers option in Analysis menu and Inhomogeneities/Interlayers Refinement option in Synthesis menu. Learn more...
• The following functions added to user-defined target definitions: $$\sqrt{}$$ - Sqrt,  $$\sqrt[3]{}$$ - Cbrt, $$\log$$ - Log, $$\log_{10}$$ - Log10, $$\tan$$ - Tan, $$\arcsin$$ - ASin, $$\arccos$$ - ACos, $$\arctan$$ - ATan, Erf - error function, $$\sinh$$ - ASinh, $$\cosh$$ - ACosh, $$\tanh$$ - ATanh. Learn more...
• Color Patch window added to Color Evaluation. It allows to obtain better understanding on current color properties of the design.

### OptiLayer Interface:

• Top of the Analysis menu has been rearranged in order to simplify access to evaluation windows.
• GD & R, GDD & R evaluation windows have been added. It allows to display GD or GDD result at the same plot as Reflectance.
• Find button has been added to databases, to file transfer dialog and to catalogs. It opens specialized panel, where it is possible to enter a mask for the wanted name (just several consecutive symbols are usually sufficient).
• In some cases when databases were cleaned the previously saved project files were not opened correctly. Fixed.
• Sorting order in drop-down lists (General Information window and others) now exactly matches the sorting order of catalog items in the corresponding databases. It greatly simplifies the election of required item especially in cases of large databases.
• Ability to set Logo (General Configuration -> Time/Date/Logo). The logo is used during all print operations as a footnote.
• Find function added to the Problem directory dialog and to File Transfer - Select directory dialog.
• The size of the Target Generator is preserved until the main Target Editor is opened. It simplifies repetitive edits with the help of Target Generator.

### COM Interfaces:

• Completed Java COM Automation example based on JavaFX platform and IntelliJ IDE. Full source code and ready-to-use Com4j JAR are included.
• Matlab OptiLayer COM example is prepared. It is also available to all customers with the full source code.

### OptiChar and OptiRE:

• JASCO spectrometers import implemented.
• Line Width and Cone Angle databases added. Computations of spectrophotometric data take Line Width and Cone Angle into account during characterization. Both Substrate and Layer characterization modes are supported. BBM evaluations currently performed without taking into account these parameters (as before).
• Total Losses and Integrated Extinction options are now available with targets having different angles for incidence for R and T characteristics. The difference in AOI should not exceed 10 degrees. If the difference is more than 0.1 degree, its value is displayed in the footnote of the corresponding plot.
• Substrate characterization has been significantly improved. Now computations are threaded and unblocking the main user interface similar to main characterization options.

### Interface in OptiChar and OptiRE:

• Find button added to databases, to file transfer dialog and to catalogs. It opens specialized panel, where it is possible to enter a mask for the wanted name (just several consecutive symbols are usually sufficient).
• Sorting order in drop-down lists (General Information window and others) now exactly matches the sorting order of catalog items in the corresponding databases. It greatly simplifies the election of required item especially in cases of large databases.
• Ability to set Logo (General Configuration -> Time/Date/Logo). The logo is used during all print operations as a footnote.
• Substrate Model is saved with comments that show loaded Measurements and the model selection.
• Layer Model is saved to layer material database with comments that show thicknesses in all representations and with indication of the Reference wavelength.
• Find function added to the Problem directory dialog and to File Transfer - Select directory dialog.
• The selection of limits for Compare Refractive index plots option is now determined by Plots Limits in Options dialog. Namely, the minimum and maximum wavelength for the Compare plots are defined as the minimum and maximum of all three Plot limits (Photometry, Ellipsometry, GD and GDD).

### Interface in OptiRE:

• In some cases when databases were cleaned the previously saved project files were not opened correctly. Fixed.
• Completed Java COM Automation examples based on JavaFX platform and IntelliJ IDE. Full source code and ready-to-use Com4j JAR included.
• Collection bug fixed: before OptiRE saved squared discrepancy value to the Collection. Now these values are just discrepancies, they are the same as displayed on the bottom of Fitting window and Reports.

### Easy to start

OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

### Docs / Support

Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.