Agilent - OptiLayer joint workshop:
“Modern spectrophotometric tools and advanced thin film software capabilities"
Tuesday 28 to Wednesday 29 November 2017 (1.5 days)
Thin Film design and production integration experts join with experts in optical metrology and spectroscopy to bring to you a workshop on the work flow of thin film products, from theory and practice, QA/QC to production and commercialization. This training helps attendees gain knowledge in the theory and practice of thin film coatings, testing and quality control. Classroom sessions cover essential theory, and practical sessions involve hands-on operation of state of the art spectroscopy instrumentation to highlight critical operational points of measurement and characerization.
Who would be interested:
Any one involved directly or indirectly in the design, development, QA/QC or commercialization of optical coatings. This includes technicians, quality personal or their managers and academics involved in thin film use or development.
|The workshop is oriented to attendees working in various fields including those who have little to no experience in OptiLayer software. Experienced OptiLayer users are also welcome to gain a new knowledge in combination with the most advanced modern spectrophotometric tools. This includes technicians, quality personal or their managers and academics involved in optical thin film applications or development.|
Expectations / Prerequisites:
You are expected to be familiar with basic UV-Vis-NIR spectroscopy theory, applications and software. If possible, please bring a sample to the course for analysis on discussion of different design and characterization problems "on the fly". If you would like additional access to the systems outside of course hours, or before/after the scheduled training, please communicate this ahead of the course and we will do our best to accommodate you.
There is a limit on the number of places available. Applications will be considered on first come, first served basis. If you miss out please contact us for information on future events.
Free to attend. Attendees must cover their own travel and accommodation costs to and from the venue.
We look forward to seeing you in Waldbronn!
|Tuesday, November 28th 2017|
|09:30||Core expertise of OptiLayer Thin Film Software|
|10:00||Spectrophotometry; Fundamentals, Scope, Benefits|
|11:00||OptiLayer analysis options. Basics of designing|
|12:00||Cary 7000 UMS Introduction, Autosampler, Cube Beamsplitter, Basic Applications|
|14:00||Cary 7000 UMS Introduction, Autosampler, Cube Beamsplitter, Basic Applications|
|14:50||OptiLayer: Basics of thin film characterization using spectral photometric data|
|16:00||Cary 7000 UMS Live Demonstration|
|16:40||Advanced OptiLayer design techniques. Pre-production error analysis|
|Wednesday, November 29th 2017|
|09:00||Import of Agilent data and advanced characterization options of OptiLayer|
|09:45||Cary 7000 UMS - Case Studies and Applications, Q&A, discussion|
|11:00||OptiLayer: Post-production characterization of optical coatings using spectral photometric data. Automation.|