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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings


What's new in OptiLayer in 2004 (version 5.03)

  •  A new feature with great potentialities has been developed in OptiLayer. This is an ability to perform designing in various environments simultaneously. We call an "environment" a given combination of layer, incident medium, and substrate indices, design targets, light sources, detectors, etc. For example, using this feature you can find a design that can be used simultaneously for several substrates with different indices or can explore different pairs of high and low index materials. An access to this feature is provided by the Environment Manager in the OptiLayer Data menu. You can specify up to 32 environments simultaneously and then to apply any of OptiLayer design modes in order to find design that can be used in all specified environments.  
  •  The latest version of OptiLayer allows using the most complete set of color coordinate systems not only in analysis modes as before but also in all OptiLayer design modes. Along with xyzL Chromaticities (CIE 1931) one can use now CIE YUV 1960, CIE YU'V' 1976, CIE L*u*v*, CIE L*a*b*, Hunter Lab, CIE C*hs(uv), CIE HLC systems. Respectively, color targets can be specified in any of these systems.
  •  A selection of the required color space is done in the Color space selector in the Color Target Editor. The Preview tab in this editor allows the user to preview specified color targets in respective color coordinate systems. For your convenience the Modify Color Target command is added in the Synthesis menu. This command enables in-memory modifications of color targets that can be later saved, if required, using the Save Color Target command in the Data menu.
  •  Color Rendering Index (CRI) calculation has been implemented in OptiLayer. The corresponding option reflects the most up-to-date trends in the developments of coatings for various color applications. In particular, a flexible choice of a set of test color samples is provided by the CRI options- tab in the Color section of the General Configuration window.
  •  To provide additional convenience, numerous other improvements have been done in OptiLayer analysis and synthesis options aimed to serve color applications. These include new color diagrams, popup context-sensitive menus in the color evaluation windows, flexible choice of reference color points, etc.
  •  OptiLayer has now Rugates option that allows you to specify and analyze rugate coatings. A powerful and easy-to-use dialog enables creating rugate coatings of any type. This dialog has a Preview option and you can easily monitor the refractive index profile of the specified rugate. It allows you to create his own database of rugates or to load some commonly used rugate filter designs.
  • Mainly in connection with the rugate option, the maximum number of layers of OptiLayer designs has been increased up to 65536. For the consistency with OptiLaye, the maximum number of layers in OptiRE has been also increased to the same value.
  • OptiLayer has now one more type of layer materials, Changeable Composite Materials. These materials are mixtures of two standard high index (H) and low index (L) materials with variable fractions of H and L materials. Materials of this new type are used in rugate coatings but are useful for some other applications as well.
  • A set of formulas for calculating refractive indices of composite materials has been extended by adding the Average Weighted Value of Refractive Indices formula. It turns out that this formula is the most appropriate one for calculating refractive indices of mixture materials obtained by the co-evaporation of widely used oxide and fluoride materials. The new formula is available in OptiLayer, OptiChar, and OptiRE.
  • The concept of the merit function used by OptiLayer has been extended. Along with the default quadratic merit function the user can specify now more sophisticated merit functions in which the difference between target and design spectral characteristics is taken in the powers from 1 to 16. The corresponding selection is done using the Power entry field at the Method tab of the Synthesis options. Sophisticated merit functions may be required for meeting some additional synthesis demands. For example, merit functions with high powers may provide the Chebyshev type (high uniformity) of the target characteristic approximation.
  •  Along with standard one-character abbreviations you can specify now also two-character abbreviations for layer materials. This was done on the demand of some customers that work with great numbers of different layer materials. Two-character abbreviations can be used by OptiLayer and OptiRE.
  •  Electric field analysis option has been essentially extended. In the case of oblique light incidence the user can now examine s- and p-components of the electric fields simultaneously. It is also possible to switch on the display of the electric field in the substrate and ambient medium.
  •  Important visualization modifications have been introduced in the OptiLayer Error Analysis option. For a better evaluation of the influence of random errors on spectral characteristics, one can specify time breaks between plotting spectral characteristics corresponding to each new set of random errors and an additional pause before plotting final statistical results of all random tests.  
  •  In OptiChar and OptiRE the Append operation has been designed in a more convenient way. This operation is used for combining separate measurement data files in one combined data file. It can be accessed now through the right-click popup menu when selecting files in the measurement database.
  • Computational efficiency of the OptiChar characterization modes has been increased several times. This is quite essential for optical characterization of thin films with many unknown model parameters when measurement data files with great numbers of data points ought to be analyzed.
  • The ability to plot coating refractive index profile has been provided in OptiRE. This enables better analyzing of the results of post-production characterization when using various OptiRE options.
  •  Systematic errors mode of OptiRE has been further developed. It includes now a model with layer thickness errors changing from layer to layer according to the linear law. Such type of systematic errors may take place when quartz crystal monitoring is used for coating production.
  •  General information window in OptiChar displays now all major model parameters. In particular, the overlayer thickness presenting small scale surface micro-roughness can be found directly in the General information window if the corresponding models have been applied for optical characterization.
  •  Comment fields for all data files were added in all OptiLayer, OptiChar, and OptiRE reports. This makes reports more informative then before

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.



Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.


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