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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings


What's new in OptiLayer in 2005 (version 5.22)

  •  Due to its outstanding computational efficiency and a great number of unique analysis, design and characterization options OptiLayer was always oriented to the top segment of thin film software market. At the beginning of 2005 an important decision was made by the OptiLayer team. Along with the standard OptiLayer version which is now called OptiLayer Pro, a new OptiLayer Lite was launched. This new version has a reduced number of options as compared to the OptiLayer Pro.  OptiLayer Lite is oriented to all segments of thin film software market. 
  •  A new Broadband monitoring simulation option continues the line of unique OptiLayer options which goal is creating the bridge between design and production. This new option enables simulating a deposition process with broadband optical monitoring of thicknesses of deposited layers. The effect of various factors on the quality of production can be examined computationally in a much cheaper and faster way that it can be done using real deposition experiments. Simulated factors include instabilities of deposition rates, random and calibration errors of on-line spectral photometric devises and more.  
  •  The new OptiLayer Pro, OptiChar and OptiRE have Import/Export of substrate and layer material dispersion data in a LDD (Leybold Dispersion Data) format. Also Monitoring Spreadsheet can now be directly transferred from OptiLayer Pro to Leybold software in LMR format (Leybold Monitoring Report). This facilitates the exchange of data between all programs of OptiLayer software family and various types of Leybold deposition plants.  
  •  An essential improvement has been done in the Copy to the Clipboard command for graphical windows. This command copies now not only graphics but also numerical data in the TAB-delimited format which considerably extends user flexibility in choosing data presentation formats. In particular, all data can be then easily pasted to MS Excel.  
  •  Now all analysis and design options of OptiLayer as well as all characterization modes of OptiChar and OptiRE allow using reflectance for the light incident on the coating from the substrate side (Back Reflectance). This option is essential for absorbing coatings, in particular, for coatings with metal layers when back reflectance differs from the reflectance for the direct light.  
  •  Flexibility of the Error Analysis option has been improved by adding a capability to choose whether independent random errors are simulated in refractive indices of all layers or independent random errors are simulated for layer materials. In the last case errors in refractive indices of layers with the same material are entirely correlated.  
  •  Interface Roughness option can be used now also for the analysis of influence of interface roughness on the spectral properties of absorbing coatings.  
  • OptiLayer Import option was extended by adding a capability to import data files in Essential Macleod format.  
  • Refractive Index Profile option allows now plotting extinction coefficient profile of a coating along with its refractive index profile.  
  •  New Memorize Plot command allows the user to retain in the computer memory a plot from the active evaluation window in order to compare it later with a new plot presented in the same window. The access to this option is provided from the main menu as well as with the help of right-click menus of corresponding windows.  


Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.



Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.


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