Our publications on post-production (reverse engineering) of optical coatings:

M. Trubetskov, T. Amotchkina, A. Tikhonravov,  V. Pervak, Reverse engineering of multilayer coatings for ultrafast laser applications, Appl. Opt., Vol. 53,  pp. A114-A120 (2014)

T. V. Amotchkina, M. K. Trubetskov, A. V. Tikhonravov, S. Schlichting, H. Ehlers, D. Ristau, D. Death, R. J. Francis, V. Pervak, Quality control of oblique incidence optical coatings based on normal incidence measurement data, Optics Express, Vol. 21, Issue 18, pp. 21508-21522 (2013).

T.V. Amotchkina, M.K. Trubetskov, A.V. Tikhonravov, V. Pervak,  "Reverse engineering of an output coupler using broadband monitoring data and group delay measurements," in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), paper WB.2.

T. Amotchkina, S. Schlichting, H. Ehlers, M. Trubetskov, A. Tikhonravov, and D. Ristau, "Computational manufacturing as a key element in the design-production chain for modern multilayer coatings," Appl. Opt. 51, 7604-7615 (2012).

T. Amotchkina, M. Trubetskov, V. Pervak, B. Romanov, and A. Tikhonravov, "On the reliability of reverse engineering results," Appl. Opt. 51, 5543-5551 (2012).

A. Tikhonravov, T. Amotchkina, M. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak. "Optical characterization and reverse engineering based on multiangle spectroscopy." Appl. Opt. 51, 245-254 (2012).

T.V. Amotchkina, V. Janicki, J. Sancho-Parramon, A.V. Tikhonravov, M.K. Trubetskov, and H. Zorc, "General approach to reliable characterization of thin metal films," Appl. Opt. 50, 10, 1453-1464 (2011).

T.V. Amotchkina, M.K. Trubetskov, V. Pervak, S.Schlichting, H. Ehlers, D. Ristau, and A.V. Tikhonravov. "Comparison of algorithms used for optical characterization of multilayer optical coatings," Appl. Opt. 50, 3389-3395 (2011).

T. Amotchkina, M. Trubetskov, V. Pervak, and A. Tikhonravov. "Design, production and reverse engineering of two-octave antireflection coatings," Appl. Opt. 50, 6468-6475 (2011).

T.V. Amotchkina, M.K. Trubetskov, A. V. Tikhonravov, V. Janicki, J. Sancho-Parramon, and H. Zorc, "Comparison of two techniques for reliable characterization of thin metal-dielectric films," Appl. Opt. 50, 6189-6197 (2011).

S. Wilbrandt, O. Stenzel, N. Kaiser, M.K. Trubetskov, and A.V. Tikhonravov, "In situ optical characterization and reengineering of interference coatings," Appl. Opt. 47, C49-C54 (2008).

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