Determination of Optical Constants
The Layer Characterization mode of OptiChar provides a choice of a model from the set of models of a homogeneous thin film. The set includes models the refractive index and extinction coefficient wavelength dependencies:
You can specify the limits for thin film parameters according to the a priori information about optical properties of the film.
Unique non-parametric models can be used in complicated characterization problems.
|Fitting of experimental reflectance data of SiO2 sample before and after characterization (put the mouse on and out of picture to see changes)||Determined refractive index of SiO2 film described by Cauchy model. Determined film thickness is shown on the bottom of the screen.|
|Our characterization approaches have been carefully verified in the frame of collaboration with the scientists from several world leading research groups. For more detail see our publications: