Systematic Errors
Systematic errors in measurement data may be caused by various factors, for example:
These factors may result in the shift of measured transmittance/reflectance data as a whole or in the scaling them by a factor that differs from 1. From a mathematical point of view, in the course of Systematic errors procedure only two unknown parameters are searched for. Optical coating model in this case can be described by vector \(X\): \[X=d_1+\Delta_H, d_2+\Delta_L,...,d_m+\Delta_H(L)\] |
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Discrepancy function is optimized with respect to systematic shifts \(\Delta_H, \Delta_L\): \[ DF^2(\Delta_H, \Delta_L)\rightarrow \min\] |
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The results of the procedure are presented as Relative, Absolute errors or correction factors for layers of active materials. Systematic errors procedure can be easily run from an external software with the help of COM Automation tool. |